Abstract: The junction temperature fluctuation of an insulated-gate bipolar transistor (IGBT) is the most important factor of its aging failure, and smoothing the fluctuation is an effective way to ...
Abstract: This paper proposed an on-line inter-turn short-circuit (ITSC) fault diagnosis approach by observing the dc component in the torque deviation for the open-end winding (OW) five-phase ...
The assembly instructions and lasercut .dxf files can be found on the skills.move by searching for the lesson "Assembly of linear and rotational modules". This library accompanies 5 free Arduino ...
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